Strain at SiSiO2 interfaces studied by Micron-Raman spectroscopy

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Bibliographic Details
Published in:Applied surface science 1989-10, Vol.39 (1-4), p.116-126
Main Authors: Brunner, K., Abstreiter, G., Kolbesen, B.O., Meul, H.W.
Format: Article
Language:eng ; jpn
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ISSN:0169-4332
DOI:10.1016/0169-4332(89)90424-8