AFM investigations of the initial stages of prepolymer film growth on aluminium

A cyanurate prepolymer was applied to aluminium-coated silicon wafers by adsorption out of solution. Film growth from the initial stages to closed films was studied by Atomic Force Microscopy. Sample preparation in the presence of external forces (spin coating) leads to film morphologies very differ...

Full description

Saved in:
Bibliographic Details
Published in:Applied surface science 1995-03, Vol.84 (3), p.273-283
Main Authors: Gesang, T., Höper, R., Dieckhoff, S., Fanter, D., Hartwig, A., Possart, W., Hennemann, O.-D.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Liquid phase epitaxy
deposition from liquid phases (melts, solutions, and surface layers on liquids)
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Physics
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A cyanurate prepolymer was applied to aluminium-coated silicon wafers by adsorption out of solution. Film growth from the initial stages to closed films was studied by Atomic Force Microscopy. Sample preparation in the presence of external forces (spin coating) leads to film morphologies very different from adsorption near equilibrium (dip coating). The edge of the non-closed films can be characterized by means of a borderline angle. The influence of specific prepolymer-substrate interactions, external forces and substrate topography is discussed.
ISSN:0169-4332
1873-5584
DOI:10.1016/0169-4332(94)00546-X