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Photocurrent spectroscopy measurements of SiGe alloys and superlattices
We used photocurrent spectroscopy at 300 K, 77 K and 4.2 K to investigate the optical absorption processes of (001) SiGe strained layer superlattices and alloys with an average composition of 50%Si-50%Ge. We observed an evolution toward higher energies of the threshold in the photocurrent spectra a...
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Published in: | Applied surface science 1996-08, Vol.102, p.272-278 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | We used photocurrent spectroscopy at 300 K, 77 K and 4.2 K to investigate the optical absorption processes of (001) SiGe strained layer superlattices and alloys with an average composition of 50%Si-50%Ge. We observed an evolution toward higher energies of the threshold in the photocurrent spectra as the period of the superlattices decreases, with the spectrum of the shortest period superlattices (2:2) approaching that of the alloy. The energy dependence of absorption in these SiGe heterostructures is quite distinct from that measured in elemental silicon. |
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ISSN: | 0169-4332 1873-5584 |
DOI: | 10.1016/0169-4332(96)00063-3 |