The determination of the structure and composition at interfaces to atomic resolution

The prediction of the properties of modern multilayered systems provides a challenge to the accuracy to which the structure of a boundary can be characterised using the transmission electron microscope (TEM). A variety of new ways of using the TEM have recently been developed in this context, and he...

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Bibliographic Details
Published in:Ultramicroscopy 1989-05, Vol.29 (1), p.18-30
Main Authors: Boothroyd, C.B., Baxter, C.S., Bithell, E.G., Hÿtch, M.J., Ross, F.M., Sato, K., Stobbs, W.M.
Format: Article
Language:English
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Summary:The prediction of the properties of modern multilayered systems provides a challenge to the accuracy to which the structure of a boundary can be characterised using the transmission electron microscope (TEM). A variety of new ways of using the TEM have recently been developed in this context, and here we describe some of the approaches which are now being applied. Particular emphasis is given to a description of the strengths and weaknesses of the Fresnel method in its potentially broad application to compositional analysis.
ISSN:0304-3991
1879-2723
DOI:10.1016/0304-3991(89)90227-1