Diffraction studies of structure in two Fe multilayers

X-ray studies of sputtered Fe-V and Fe-Si LMS as a function of Fe layer thickness were used to determine the structure perpendicular to the layers. These studies showed the types of behavior expected of LMS and were generally consistent with results from existing previous studies. Electron diffracti...

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Bibliographic Details
Published in:Ultramicroscopy 1989-05, Vol.29 (1), p.80-87
Main Author: Foiles, C.L.
Format: Article
Language:English
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Summary:X-ray studies of sputtered Fe-V and Fe-Si LMS as a function of Fe layer thickness were used to determine the structure perpendicular to the layers. These studies showed the types of behavior expected of LMS and were generally consistent with results from existing previous studies. Electron diffraction studies were used to obtain information about the in-plane structure of these LMS. For each system specific forms of in-plane structure developed as the Fe layer thickness decreased. The superlattice system Fe-V developed a common BCC lattice for t Fe≲ 25 Å. The Fe-Si system showed a loss of long-range order as t Fe decreased; however, a simple transition from crystalline to amorphous form does not correctly describe this loss of order.
ISSN:0304-3991
1879-2723
DOI:10.1016/0304-3991(89)90233-7