Measurements of lateral distribution of fluorescence intensities and fluorescence spectra of microareas by a combined SNOM and AFM

In the present combined scanning near-field optical microscope (SNOM) / atomic force microscope (AFM), we took advantage of the non-contact AFM to control the tip-sample distance for SNOM without mechanical damages of the tip and sample surfaces. By precise control of the distance of the optical fib...

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Bibliographic Details
Published in:Ultramicroscopy 1995-02, Vol.57 (2), p.118-123
Main Authors: Fujihira, M., Monobe, H., Muramatsu, H., Ataka, T.
Format: Article
Language:English
Subjects:
Atomic force microscopes
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Near-field scanning optical microscopes
Physics
Scanning probe microscopes, components and techniques
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Summary:In the present combined scanning near-field optical microscope (SNOM) / atomic force microscope (AFM), we took advantage of the non-contact AFM to control the tip-sample distance for SNOM without mechanical damages of the tip and sample surfaces. By precise control of the distance of the optical fiber tip from the sample surface of less than 100 nm, we succeeded in obtaining fluorescence micrographs and also fluorescence spectra of localized microareas of a fluorescent thin film coated on a chromium checkerboard pattern.
ISSN:0304-3991
1879-2723
DOI:10.1016/0304-3991(94)00122-4