Benefits of energy filtering for advanced convergent beam electron diffraction patterns

Energy filtering is well known to have a dramatic effect on the appearance of standard, zone-axis convergent beam electron diffraction patterns. In this paper, the effects of energy filtering on some less-common types of CBED patterns are shown. In particular, the (002) and (402) quasi-forbidden ref...

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Bibliographic Details
Published in:Ultramicroscopy 1994-09, Vol.55 (3), p.276-283
Main Authors: Burgess, W.G., Preston, A.R., Botton, G.A., Zaluzec, N.J., Humphreys, C.J.
Format: Article
Language:English
Subjects:
Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
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Summary:Energy filtering is well known to have a dramatic effect on the appearance of standard, zone-axis convergent beam electron diffraction patterns. In this paper, the effects of energy filtering on some less-common types of CBED patterns are shown. In particular, the (002) and (402) quasi-forbidden reflections in silicon are investigated, and the effects of energy filtering demonstrated. The filtering of HOLZ excess lines in large-angle zone-axis patterns is shown, as these patterns are of interest for Debye-Waller factor determination. Filtered and unfiltered bright-field large-angle CBED (LACBED) patterns of aluminum are presented along with EELS spectra to demonstrate the partial removal of inelastically scattered electrons due to the LACBED geometry.
ISSN:0304-3991
1879-2723
DOI:10.1016/0304-3991(94)90062-0