Piezo-electric tuning fork tip—sample distance control for near field optical microscopes

In a recent paper [Karraï and Grober, Appl. Phys. Lett. 66 (1995) 1842], a new technique was developed in order to control the distance separation between a tapered metal-coated optical fiber tip and the surface of a sample. This new technique is based on a piezo-electric tuning fork used as a shear...

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Bibliographic Details
Published in:Ultramicroscopy 1995-12, Vol.61 (1), p.197-205
Main Authors: Karraï, Khaled, Grober, Robert D.
Format: Article
Language:English
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Summary:In a recent paper [Karraï and Grober, Appl. Phys. Lett. 66 (1995) 1842], a new technique was developed in order to control the distance separation between a tapered metal-coated optical fiber tip and the surface of a sample. This new technique is based on a piezo-electric tuning fork used as a shear-force detector. The fiber tip, which is attached along one of the arms of the tuning fork, acts as a shear-force pick-up. We present in this article the idealized model analysis that leads to the design parameters of a tuning fork optimized for near-field scanning optical microscopy.
ISSN:0304-3991
1879-2723
DOI:10.1016/0304-3991(95)00104-2