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An improved mode of operation of a transmission electron microscope for wide field off-axis holography

An improved mode of operation for low magnification off-axis electron holography is presented which permits a significant increase of the field of view over that obtained by the standard low magnification technique in a standard field emission transmission electron microscope. This improvement is ac...

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Bibliographic Details
Published in:Ultramicroscopy 1996-04, Vol.63 (1), p.15-20
Main Authors: Frost, B.G., Voelkl, E., Allard, L.F.
Format: Article
Language:English
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Summary:An improved mode of operation for low magnification off-axis electron holography is presented which permits a significant increase of the field of view over that obtained by the standard low magnification technique in a standard field emission transmission electron microscope. This improvement is achieved by a weak excitation of the objective lens. Ray diagrams for the different low magnification modes are discussed and verified on a Hitachi HF-2000 transmission electron microscope operated in free lens control mode.
ISSN:0304-3991
1879-2723
DOI:10.1016/0304-3991(96)00046-0