A structural characterization of the buffer layer for growth of magnetically coupled Co/Cu superlattices

The maximum value of the magnetoresistance reported so far has been obtained in Co/Cu multilayers grown by sputtering on Si wafers with a buffer layer of 50Åof Fe. It has been claimed that this Fe buffer layer provides a better template for growth than Cu(100) single crystals. We demonstrate here th...

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Bibliographic Details
Published in:Journal of magnetism and magnetic materials 1993-03, Vol.121 (1), p.20-23
Main Authors: Martínez-Albertos, J.L., Camarero, J., García, J.M., Pastor, C.J., Gallego, J.M., Limones, C., Prieto, J.E., Parga, A.L. Vázquez de, de la Figuera, J., Ocal, C., Miranda, R.
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
Metals. Metallurgy
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Summary:The maximum value of the magnetoresistance reported so far has been obtained in Co/Cu multilayers grown by sputtering on Si wafers with a buffer layer of 50Åof Fe. It has been claimed that this Fe buffer layer provides a better template for growth than Cu(100) single crystals. We demonstrate here that Fe films, even when deposited in UHV conditions, represent a reacted, nonepitaxial template which results in low structural perfection of Co/Cu multilayers.
ISSN:0304-8853
DOI:10.1016/0304-8853(93)91139-X