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X-ray photoelectron spectra (XPS) of flavonoid parent compounds

Core ionization properties of flavonoid parent compounds were studied using X-ray photoelectron spectroscopy and the XPS and HAM/3 methods. The theoretical and experimental data were found to be in fairly good agreement. It was concluded that the structural characteristics are reflected in the core...

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Bibliographic Details
Published in:Journal of electron spectroscopy and related phenomena 1992-10, Vol.59 (4), p.315-325
Main Authors: Dinya, Zoltán, Komáromi, István, Lévai, Albert
Format: Article
Language:English
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Summary:Core ionization properties of flavonoid parent compounds were studied using X-ray photoelectron spectroscopy and the XPS and HAM/3 methods. The theoretical and experimental data were found to be in fairly good agreement. It was concluded that the structural characteristics are reflected in the core ionization energies.
ISSN:0368-2048
1873-2526
DOI:10.1016/0368-2048(92)87011-A