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X-ray photoelectron spectra (XPS) of flavonoid parent compounds
Core ionization properties of flavonoid parent compounds were studied using X-ray photoelectron spectroscopy and the XPS and HAM/3 methods. The theoretical and experimental data were found to be in fairly good agreement. It was concluded that the structural characteristics are reflected in the core...
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Published in: | Journal of electron spectroscopy and related phenomena 1992-10, Vol.59 (4), p.315-325 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Core ionization properties of flavonoid parent compounds were studied using X-ray photoelectron spectroscopy and the XPS and HAM/3 methods. The theoretical and experimental data were found to be in fairly good agreement. It was concluded that the structural characteristics are reflected in the core ionization energies. |
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ISSN: | 0368-2048 1873-2526 |
DOI: | 10.1016/0368-2048(92)87011-A |