Relaxation energies in XPS and XAES of solid sulfur compounds

Solid sulfur compounds have been investigated by XPS/XAES chemical shift measurements of the S 1s, S 2p, and S KLL peaks. Auger parameters and relaxation energies have been derived. The relaxation energy was discussed in terms of initial state charge and dielectric screening models. A local screenin...

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Bibliographic Details
Published in:Journal of electron spectroscopy and related phenomena 1994-05, Vol.68, p.321-328
Main Authors: Peisert, H., Chassé, T., Streubel, P., Meisel, A., Szargan, R.
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron and ion emission by liquids and solids
impact phenomena
Electron density of states and band structure of crystalline solids
Electron states
Exact sciences and technology
Other inorganic compounds
Photoemission and photoelectron spectra
Physics
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Summary:Solid sulfur compounds have been investigated by XPS/XAES chemical shift measurements of the S 1s, S 2p, and S KLL peaks. Auger parameters and relaxation energies have been derived. The relaxation energy was discussed in terms of initial state charge and dielectric screening models. A local screening model was used to calculate relaxation energy shifts semiquantitatively. The effect of crystal water has been illustrated. A comparison of trends in the relaxation energy of the third row elements silicon, phosphorus, and sulfur shows striking similarities.
ISSN:0368-2048
1873-2526
DOI:10.1016/0368-2048(94)02129-5