Thickness dependence of the resistive transition of superconducting films

Superconducting transition curves were measured for a series of amorphous bismuth films having thicknesses ranging from 100 to 2240 Å. Above the transition temperature the electrical conductivity varied as ( T − T c) -1. The constant multiplying this factor was found to be proportional to the residu...

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Bibliographic Details
Published in:Physics letters. A 1968-01, Vol.28 (2), p.110-111
Main Authors: Naugle, D.C., Glover, R.E.
Format: Article
Language:English
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Summary:Superconducting transition curves were measured for a series of amorphous bismuth films having thicknesses ranging from 100 to 2240 Å. Above the transition temperature the electrical conductivity varied as ( T − T c) -1. The constant multiplying this factor was found to be proportional to the residual resistance of the film. Values are in quantitative agreement with an expression based on the microscopic theory of superconductivity.
ISSN:0375-9601
1873-2429
DOI:10.1016/0375-9601(68)90416-7