New observations on the electrical properties and instabilities of pure and metal doped SiO2 films

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Bibliographic Details
Published in:Physica B + C 1985-01, Vol.129 (1-3), p.245-248
Main Authors: Krishna, K.V., Delima, J.J., Eze, F.C., Owen, A.E.
Format: Article
Language:English
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ISSN:0378-4363
DOI:10.1016/0378-4363(85)90578-9