AES and RBS analysis of laser mixed Cr and Ni multilayer films on Cu alloys

The chemical analysis of Cr and Ni multilayer films laser mixed with Cu alloy substrates has been carried out with Auger electron and Rutherford backscattering spectroscopies. For multilayer transition metal on metal systems, such as Cu/Cr/Ni, the complementary use of both AES and RBS results in a m...

Full description

Saved in:
Bibliographic Details
Published in:Applications of surface science 1984, Vol.18 (1), p.86-105
Main Authors: Sawchyn, I., Draper, C.W.
Format: Article
Language:English
Subjects:
Analysing. Testing. Standards
Analytical chemistry
Applied sciences
Chemistry
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Materials testing
Metals, semimetals and alloys
Metals. Metallurgy
Physics
Specific materials
Spectrometric and optical methods
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The chemical analysis of Cr and Ni multilayer films laser mixed with Cu alloy substrates has been carried out with Auger electron and Rutherford backscattering spectroscopies. For multilayer transition metal on metal systems, such as Cu/Cr/Ni, the complementary use of both AES and RBS results in a more detailed understanding of the laser mixed compositional profiles than would result from the application of either technique alone. The relative strengths and weaknesses of both analytical methods are pointed out.
ISSN:0378-5963
DOI:10.1016/0378-5963(84)90039-4