XPS and IR study of electrochemically or chemically redoped poly(3-methylthienylene) films

• Published in: Synthetic metals 1985-01, Vol.11 (3), p.139-157
• Main Authors: Hotta, Shu, Shimotsuma, Wataru, Taketani, Makoto, Kohiti, Shigemi
• Format: Article
• Language: English
• Subjects: Applied sciences; Exact sciences and technology; Inorganic and organomineral polymers; Physicochemistry of polymers; Properties and characterization
• ISSN: 0379-6779; 1879-3290
• DOI: 10.1016/0379-6779(85)90060-8

XPS (X-ray photoemission spectroscopy) and IR (infrared) analyses of poly(3-methylthienylene) films, electrochemically or chemically redoped0 with various chemical species at varying doping levels, have been investigated. On the basis of these results, the major chemical species of dopants have been identified. As a results, the dopant content was determined and the poly(3-methylthienylene) films were classified as light or heavy by doping level. The conductivity ranged from about 10 −12 to 10 2 S cm −1 for all the films investigated. The conductivity and the activation energy of conduction for the heavily-doped films vary as a function of the dopant content, independent of the different chemical species of dopants. In particular, a sudden change is observed in the dependence of activation energy on dopant content. This sudden change may be associated with the semi-conductor-metal transition. Furthermore, it is shown that the specific absorption bands in the infrared are induced by the doping, intensified with increasing dopant uptake and accompanied by an increase in conductivity.