Particle induced X-ray emission (PIXE) and radiochemistry study of poly(pyrrole) doped with toluenesulfonate or polystyrenesulfonate anions

Poly(pyrrole) films have been prepared at constant current using two different doping ions (i.e., toluenesulfonate ions or polystyrenesulfonate ions). Particle induced X-ray emission experiments show that incorporation is reversible with toluenesulfonate anions: when the films are reduced in 0.1 mol...

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Bibliographic Details
Published in:Synthetic metals 1995-12, Vol.75 (3), p.181-185
Main Authors: Stéphen, O., Carrier, M., Page, J., Frontier, J.P., Trouslard, P.
Format: Article
Language:English
Subjects:
Applied sciences
Doping
Electrical, magnetic and optical properties
Exact sciences and technology
Organic polymers
Particle induced X-ray emission
Physicochemistry of polymers
Poly(pyrrole)
Properties and characterization
Radiochemistry
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Summary:Poly(pyrrole) films have been prepared at constant current using two different doping ions (i.e., toluenesulfonate ions or polystyrenesulfonate ions). Particle induced X-ray emission experiments show that incorporation is reversible with toluenesulfonate anions: when the films are reduced in 0.1 mol dm −3 KNO 3 solutions, all the anions incorporated during the synthesis are released. With polystyrenesulfonate ions, however, the incorporation is irreversible. It is likely that such films have cation exchanging properties. This phenomenon has been studied using barium ions, the incorporation of which was monitored using a radiochemical method.
ISSN:0379-6779
1879-3290
DOI:10.1016/0379-6779(96)80005-1