Determination of concentration depth profiles by spark source mass spectroscopy

SSMS in-depth analysis was used to study diffusion profiles of Be in Cu, which extend over some millimeters. The calculated diffusion coefficients agree well with values measured on the same samples by both lateral SSMS and SIMS.

Saved in:
Bibliographic Details
Published in:Spectrochimica acta. Part B: Atomic spectroscopy 1985, Vol.40 (5), p.769-772
Main Authors: Swenters, K., Verlinden, J., Gijbels, R.
Format: Article
Language:English
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:SSMS in-depth analysis was used to study diffusion profiles of Be in Cu, which extend over some millimeters. The calculated diffusion coefficients agree well with values measured on the same samples by both lateral SSMS and SIMS.
ISSN:0584-8547
1873-3565
DOI:10.1016/0584-8547(85)80127-0