Methodological solutions for the analysis of sediment samples by direct sample insertion inductively coupled plasma atomic emission

Results for the calibration of the direct sample insertion technique (DSI) with sediment standards are reported for inductively coupled plasma atomic emission spectrometry (ICP-AES). It has been found that internal standardization can compensate for variations in volatilization interferences and cha...

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Bibliographic Details
Published in:Spectrochimica acta. Part B: Atomic spectroscopy 1992-02, Vol.47 (2), p.205-217
Main Authors: Blain, L., Salin, E.D.
Format: Article
Language:English
Subjects:
Analytical chemistry
Chemistry
Exact sciences and technology
Spectrometric and optical methods
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Summary:Results for the calibration of the direct sample insertion technique (DSI) with sediment standards are reported for inductively coupled plasma atomic emission spectrometry (ICP-AES). It has been found that internal standardization can compensate for variations in volatilization interferences and changes in excitation conditions between sediment standards, for elements of high and intermediate volatility (Cd, Cu, Hg, Mn, Pb and Zn). It has also been found that the method of standard additions allows accurate calibration of the technique. Sub-ppm detection limits were typlcal for elements of high and intermediate volatility.
ISSN:0584-8547
1873-3565
DOI:10.1016/0584-8547(92)80021-8