Optimisation of total-reflection X-ray fluorescence for aerosol analysis

The capabilities of total-reflection X-ray fluorescence (TXRF) analysis were investigated to develop an efficient, simple, rapid and low cost analytical method for aerosols. The technique involves direct impaction of airborne particulate matter on the quartz sample-reflector discs for TXRF. Special...

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Bibliographic Details
Published in:Spectrochimica acta. Part B: Atomic spectroscopy 1995-12, Vol.50 (14), p.1787-1803
Main Authors: Injuk, Jasna, Van Grieken, René
Format: Article
Language:English
Subjects:
Aerosol
Air analysis
Analytical chemistry
Chemistry
Exact sciences and technology
Spectrometric and optical methods
Total-reflection X-ray fluorescence
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Summary:The capabilities of total-reflection X-ray fluorescence (TXRF) analysis were investigated to develop an efficient, simple, rapid and low cost analytical method for aerosols. The technique involves direct impaction of airborne particulate matter on the quartz sample-reflector discs for TXRF. Special attention was paid to bounce-off effects, and hence the aerosol size distributions for the impactor stages; influence of siliconizing the quartz discs on the adhesion of particles; choice of the internal standard; local distribution of the material deposited on the quartz disc; and alternative materials for aerosol collection. Moreover, the proposed method could be used in combination with a one-stage impactor for total aerosol mass collection and analysis.
ISSN:0584-8547
1873-3565
DOI:10.1016/0584-8547(95)01375-X