Synchrotron X-radiation topography

The application of synchrotron radiation for X-ray topography is reviewed. For two types of experiment, dynamic studies and statistical surveys, the intensity and continuous spectrum of synchrotron radiation is particularly important but it is shown that the time structure and polarisation can also...

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Bibliographic Details
Published in:Materials science reports 1992, Vol.8 (8), p.371-407
Main Authors: Tanner, B.K., Bowen, D.K.
Format: Article
Language:English
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Summary:The application of synchrotron radiation for X-ray topography is reviewed. For two types of experiment, dynamic studies and statistical surveys, the intensity and continuous spectrum of synchrotron radiation is particularly important but it is shown that the time structure and polarisation can also be exploited. The future potential of the technique is discussed.
ISSN:0920-2307
1878-2701
DOI:10.1016/0920-2307(92)90002-I