Photoelectron diffraction analysis of diamond and metal-diamond interfaces

X-ray photoelectron diffraction (XPD), a newly established technique in surface science, was used to investigate the diamond (111) surface as well as the growth of Cu on this surface. Measurements are presented along with single-scattering-cluster calculations. From these measurements it is clearly...

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Bibliographic Details
Published in:Diamond and related materials 1993-03, Vol.2 (2), p.548-551
Main Authors: Kuettel, O.M., Osterwalder, J., Schlapbach, L., Agostino, R.
Format: Article
Language:English
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Summary:X-ray photoelectron diffraction (XPD), a newly established technique in surface science, was used to investigate the diamond (111) surface as well as the growth of Cu on this surface. Measurements are presented along with single-scattering-cluster calculations. From these measurements it is clearly seen that Cu grows epitaxially on top of the diamond (111) surface. XPD proves to be an adequate diagnostic technique to study diamond surfaces and growth processes.
ISSN:0925-9635
1879-0062
DOI:10.1016/0925-9635(93)90118-L