Effect of thickness and surface treatment on silicon water reflectance

In this paper we present reflectance measurements on silicon wafers and the dependence of the reflectance on the thickness, on the texturization and on the back metallization. Silver and aluminum have been deposited using screen printing and also vacuum evaporation as a reference. The work was inten...

Full description

Saved in:
Bibliographic Details
Published in:Solar energy materials and solar cells 1992, Vol.27 (3), p.265-272
Main Authors: Carotta, M.C., Merli, M., Passari, L., Palmeri, D., Martinelli, G., Van Steenwinkel, R.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this paper we present reflectance measurements on silicon wafers and the dependence of the reflectance on the thickness, on the texturization and on the back metallization. Silver and aluminum have been deposited using screen printing and also vacuum evaporation as a reference. The work was intended as a contribution to the problem of light trapping that becomes important for thin wafers for commercial, low cost, silicon cells. For the case of wafers with polished surfaces, the results are analysed to yield the reflectivity of the back surface and the total energy absorbed in the sample. Texturization, on the contrary, introduces diffraction phenomena making the evaluation of the absorbed energy more complex.
ISSN:0927-0248
1879-3398
DOI:10.1016/0927-0248(92)90088-7