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Thermal expansion behavior of NiSi/NiSi2
The thermal expansion of NiSi/NiSi2 for a range of temperatures from 293 to 1223 K was determined using high-temperature X-ray diffraction. While a linear relation with temperature was found for the lattice parameter of NiSi2, third-order relationships were found for the three lattice parameters of...
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Published in: | Scripta metallurgica et materialia 1992-01, Vol.26 (1), p.85-88 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that cite this one |
Online Access: | Get full text |
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Summary: | The thermal expansion of NiSi/NiSi2 for a range of temperatures from 293 to 1223 K was determined using high-temperature X-ray diffraction. While a linear relation with temperature was found for the lattice parameter of NiSi2, third-order relationships were found for the three lattice parameters of NiSi, with one of the parameters showing a decrease with increasing temperature. The volumetric expansion of both materials exhibited linear relationships. |
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ISSN: | 0956-716X |
DOI: | 10.1016/0956-716X(92)90374-N |