Atomic force microscopy study of FG-annealed and PECVD silicon nitride AR-coated silicon solar cells

Atomic force microscopy has been used to study the surface structure and roughness of PECVD silicon nitride coated silicon solar cells. The surface roughness increases in some areas of the solar cells after forming gas annealing. It may be one of the reasons for better light absorption on the surfac...

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Bibliographic Details
Published in:Renewable energy 1995-07, Vol.6 (5), p.589-591
Main Authors: Kishore, R., Moutinho, H.R., Sopori, B.L.
Format: Article
Language:English
Subjects:
Applied sciences
Energy
Exact sciences and technology
Natural energy
Photovoltaic conversion
Solar cells. Photoelectrochemical cells
Solar energy
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Summary:Atomic force microscopy has been used to study the surface structure and roughness of PECVD silicon nitride coated silicon solar cells. The surface roughness increases in some areas of the solar cells after forming gas annealing. It may be one of the reasons for better light absorption on the surface of the solar cells resulting in better solar cell performance.
ISSN:0960-1481
1879-0682
DOI:10.1016/0960-1481(95)00054-N