Measurement of total and photoelectric cross sections of rare earth elements present in compounds for 123.6 keV and 145.4 keV photons

• Published in: Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 1996-06, Vol.47 (6), p.801-805
• Main Authors: Jahagirdar, H.A., Hanumaiah, B., Thontadarya, S.R.
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Exact sciences and technology; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Other interactions of matter with particles and radiation; Physics; X-ray emission spectra and fluorescence; X-ray emission threshold and fluorescence
• ISSN: 0969-806X; 1879-0895
• DOI: 10.1016/0969-806X(95)00408-P

A new, simple and direct method proposed earlier by us has been employed here to measure the total photoelectric cross section of rare earth elements in the range 58 ⩽ Z ⩽ 66 present in compounds at 123.6 keV and 145.4 keV photon energies. The K X-ray fluorescence intensities emitted by these elements, from irradiating their compounds by the photons of above energies, are measured using a NaI (Tl) spectrometer system in a 2π geometrical configuration. The K X-ray fluorescence cross sections of the rare earth elements are determined, from which the total photoelectric cross sections are evaluated. Total mass attenuation coefficients of compounds for the K X-ray and the incident radiations respectively have been measured and these values were compared with the corresponding theoretical values and a good agreement between them is obtained.