The effects of critical charge variance on space upset rate

Sources of variance that may significantly affect space upset rate are analyzed and reduced to two main cases. Also, the current method of extracting critical charge from ground test data is noted to be inadequate for the most general case. Variance is propagated in the rounded shape model and appli...

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Bibliographic Details
Published in:Radiation measurements 1996-05, Vol.26 (3), p.503-508
Main Author: Langworthy, James B.
Format: Article
Language:English
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Summary:Sources of variance that may significantly affect space upset rate are analyzed and reduced to two main cases. Also, the current method of extracting critical charge from ground test data is noted to be inadequate for the most general case. Variance is propagated in the rounded shape model and applied to fitting the device cross section. The experience with this fitting generally supports the contribution of variance to the shape of the cross section. Then variance is propagated in the space upset rate and it is found that variance can be, but is not always, important. The result shows that variance is at least a nuisance, since it must be removed from the cross section in order to obtain model parameters.
ISSN:1350-4487
1879-0925
DOI:10.1016/1350-4487(96)00055-8