Influence of temperature on track registration in olivine

Track etch rate and total etchable track length have been compared for Xe ion tracks registered in olivine crystals, at two different temperatures (160K and 293K). A small registration temperature effect has been found. It appears to vary with the crystallographic orientation of the tracks, beeing n...

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Bibliographic Details
Published in:International journal of radiation applications and instrumentation. Part D, Nuclear tracks and radiation measurements Nuclear tracks and radiation measurements, 1988, Vol.15 (1), p.45-46
Main Authors: Perron, C., Bourot-Denise, M.
Format: Article
Language:English
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Summary:Track etch rate and total etchable track length have been compared for Xe ion tracks registered in olivine crystals, at two different temperatures (160K and 293K). A small registration temperature effect has been found. It appears to vary with the crystallographic orientation of the tracks, beeing nearly inexistent in some cases. Because of its small amplitude, this effect should not pose any serious problem for the study of ultraheavy cosmic ray tracks in meteorites.
ISSN:1359-0189
1878-1691
DOI:10.1016/1359-0189(88)90099-4