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Study of layered and defective amorphous solids by means of thermal wave method

In this work the thermal properties and the thickness calibration in layered thick acrylic films using the thermal wave method are reported. The results from acrylic films on two different substrates showed that thermal diffusivity and conductivity can be measured for both supports, metallic and gla...

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Bibliographic Details
Published in:Journal of non-crystalline solids 2003-04, Vol.318 (3), p.314-321
Main Authors: Nogueira, E.S, Pereira, J.R.D, Baesso, M.L, Bento, A.C
Format: Article
Language:English
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Summary:In this work the thermal properties and the thickness calibration in layered thick acrylic films using the thermal wave method are reported. The results from acrylic films on two different substrates showed that thermal diffusivity and conductivity can be measured for both supports, metallic and glassy. The experimental applicability of a 1-D model and accuracy of the thickness measurement are also discussed.
ISSN:0022-3093
1873-4812
DOI:10.1016/S0022-3093(02)01893-8