Enhanced backscatter from monodisperse contaminants on a substrate

Enhanced backscatter has been used to characterize rough, irregular substrates and polydispersions of contaminants on a substrate. For monodisperse contaminants, the enhanced-backscatter peak can be obscured by the structure of the total intensity signal. Averaging backscatter intensities from a sub...

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Bibliographic Details
Published in:Journal of quantitative spectroscopy & radiative transfer 1999-09, Vol.63 (2), p.383-392
Main Authors: de la Peña, J.L., Saiz, J.M., Valle, P.J., González, F., Moreno, F., Videen, Gorden
Format: Article
Language:English
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Summary:Enhanced backscatter has been used to characterize rough, irregular substrates and polydispersions of contaminants on a substrate. For monodisperse contaminants, the enhanced-backscatter peak can be obscured by the structure of the total intensity signal. Averaging backscatter intensities from a substrate contaminated by monodisperse contaminants when the system is illuminated by plane waves of different incident angles removes the structure of the individual intensity signals, isolating the backscatter peak. The resulting peak contains information which can be used to characterize the contaminants. We demonstrate this technique by modeling the size and shape of this peak for monodisperse spherical contaminants on a substrate and comparing these results with experimental measurements.
ISSN:0022-4073
1879-1352
DOI:10.1016/S0022-4073(99)00026-6