Oscillation-based test in oversampled ΣΔ modulators

This paper discusses a way of applying the oscillation-based test (OBT)/oscillation-based built-in-self test concept to oversampled ΣΔ modulators, exploiting previous experience coined through the implementation of OBT in SC integrated filters. Analytical and simulation results demonstrate that it i...

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Bibliographic Details
Published in:Microelectronics 2002-10, Vol.33 (10), p.799-806
Main Authors: Huertas, Gloria, Vázquez, Diego, Peralı́as, Eduardo, Rueda, Adoración, Huertas, José L
Format: Article
Language:English
Subjects:
Design for test
Mixed-signal design
Oscillation-based test
Test of ΣΔ modulators
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Summary:This paper discusses a way of applying the oscillation-based test (OBT)/oscillation-based built-in-self test concept to oversampled ΣΔ modulators, exploiting previous experience coined through the implementation of OBT in SC integrated filters. Analytical and simulation results demonstrate that it is always feasible to find out an OBT configuration for a typical discrete-time second-order modulator structure without adding a substantial extra circuitry, but only resorting to local feedback loops. A feedback strategy can be chosen providing enough freedom to force oscillations, which can be worthwhile for testing purposes. The selected oscillation parameters allow us to establish criteria for a high fault coverage.
ISSN:1879-2391
1879-2391
DOI:10.1016/S0026-2692(02)00095-2