A complementary molecular-model (including field and current) for TDDB in SiO 2 dielectrics

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Bibliographic Details
Published in:Microelectronics and reliability 2000-08, Vol.40 (8-10), p.1591-1597
Main Authors: McPherson, J.W., Khamankar, R.B., Shanware, A.
Format: Article
Language:English
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ISSN:0026-2714
DOI:10.1016/S0026-2714(00)00172-4