Reliability studies on integrated GaAs power-sensor structures using pulsed electrical stress

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Bibliographic Details
Published in:Microelectronics and reliability 2003-09, Vol.43 (9), p.1929-1933
Main Authors: Sydlo, C., Mutamba, K., Divac Krnic, L., Mottet, B., Hartnagel, H.L.
Format: Article
Language:English
Online Access:Get full text
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ISSN:0026-2714
1872-941X
DOI:10.1016/S0026-2714(03)00327-5