Low-frequency noise in thick-film structures caused by traps in glass barriers

In this paper a model of low-frequency noise in thick-film structures based on the close relationship of the noise and conduction mechanisms is presented. The emphasis is placed on the presence of traps in thin, glass barriers as the least studied source of low-frequency noise in thick-film structur...

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Bibliographic Details
Published in:Microelectronics and reliability 1998-10, Vol.38 (10), p.1569-1576
Main Authors: Mrak, I., Jevtić, M.M., Stanimirović, Z.
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
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Summary:In this paper a model of low-frequency noise in thick-film structures based on the close relationship of the noise and conduction mechanisms is presented. The emphasis is placed on the presence of traps in thin, glass barriers as the least studied source of low-frequency noise in thick-film structures under conditions of dominant tunneling current flow. The influence of contacts between some of the adjacent conducting particles on noise is discussed. From numerical simulation, fitting the experimental results and theoretical curve based on the proposed model, we found that the noise is sensitive to the thick-film structure.
ISSN:0026-2714
1872-941X
DOI:10.1016/S0026-2714(98)00032-8