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A new technique for obtaining uniform intensity line focus of Gaussian laser beams
Uniform intensity line focussing of Gaussian laser beams has many applications in different areas e.g., XUV-soft X-ray laser research, material processing, pumping of dye lasers etc. Some of these may also require a line focus of variable length with same uniform intensity. In this paper, we describ...
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Published in: | Optics communications 2003-07, Vol.223 (1), p.137-142 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Uniform intensity line focussing of Gaussian laser beams has many applications in different areas e.g., XUV-soft X-ray laser research, material processing, pumping of dye lasers etc. Some of these may also require a line focus of variable length with same uniform intensity. In this paper, we describe a simple technique using a wedge to displace and overlap two halves of a Guassian laser beam to obtain a uniform intensity line focus. Variation of the line length at a fixed intensity is accomplished by using appropriate masks. X-ray emission pictures of a line focussed laser produced plasma show the effectiveness of this geometry. |
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ISSN: | 0030-4018 1873-0310 |
DOI: | 10.1016/S0030-4018(03)01544-X |