An XPS study of the influence of impurity Cu on the electronic structure of SrS

In this work the influence of Cu on X-ray photoelectron Sr 3d and S 2p spectra for low Cu concentrations in SrS is studied. The Cu impurity in the SrS lattice is detected by SIMS and X-ray diffractometry. Careful analysis of the S 2p and Sr 3d spectra shows that the Cu impurity at concentrations les...

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Bibliographic Details
Published in:Surface science 2000-05, Vol.454, p.529-533
Main Authors: Vdovenkova, T., Vdovenkov, A., Soininen, E.
Format: Article
Language:English
Subjects:
Alkaline earth metals
Copper
Semiconducting films
Sulphur
X-ray photoelectron spectroscopy
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Summary:In this work the influence of Cu on X-ray photoelectron Sr 3d and S 2p spectra for low Cu concentrations in SrS is studied. The Cu impurity in the SrS lattice is detected by SIMS and X-ray diffractometry. Careful analysis of the S 2p and Sr 3d spectra shows that the Cu impurity at concentrations less than the XPS sensitivity limit has its main influence on the S 2p doublets that correspond to sulphur in SrS and to elementary sulphur clusters. SrS doping by Cu with subsequent annealing is accompanied by a decrease in the sulphur clusters size and leads to downward band bending and/or n-doping of SrS.
ISSN:0039-6028
1879-2758
DOI:10.1016/S0039-6028(00)00226-0