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Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

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Bibliographic Details
Published in:	Surface science 2001-11, Vol.493 (1-3), p.29-35
Main Authors:	SHIRAKI, S, ISHII, H, AMANO, M, NIHEI, Y, OWARI, M, OSHIMA, C, KOSHIKAWA, T, SHIMIZU, R
Format:	Article
Language:	English
Subjects:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Solid surfaces and solid-solid interfaces Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
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