Growth of Sn thin films on CdTe(111)

The formation and the growth of Sn films on CdTe(111) have been studied by hemispherically recorded ARXPS. The XPD patterns show that these films consist of α-Sn. XPD and ARXPS depth profile analysis reveal the presence of an intermixing zone at the interface which establishes during the initial sta...

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Bibliographic Details
Published in:Surface science 1997-04, Vol.377, p.904-908
Main Authors: Zimmermann, H., Keller, Robert C., Meisen, P., Seelmann-Eggebert, M.
Format: Article
Language:English
Subjects:
ARXPS
CdTe
Contact
Interface intermixing
XPD
α-Tin
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Summary:The formation and the growth of Sn films on CdTe(111) have been studied by hemispherically recorded ARXPS. The XPD patterns show that these films consist of α-Sn. XPD and ARXPS depth profile analysis reveal the presence of an intermixing zone at the interface which establishes during the initial stages of film formation.
ISSN:0039-6028
1879-2758
DOI:10.1016/S0039-6028(96)01519-1