How to extract spontaneous polarization information from experimental data in electric force microscopy

To derive the spontaneous polarization of a sample, the first harmonic signal of the electric force microscope (EFM) must be corrected using the permittivity. This can be deduced from a simple EFM-force model and has been verified in experiments. For thin films of high permittivity, any gap of air b...

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Bibliographic Details
Published in:Surface science 1998-09, Vol.415 (1), p.178-182
Main Authors: Franke, K., Huelz, H., Weihnacht, M.
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Dielectric thin films
Dielectrics, piezoelectrics, and ferroelectrics and their properties
Exact sciences and technology
Ferroelectricity
Ferroelectricity and antiferroelectricity
Microscopy atomic force
Physics
Polarization dielectric
Thin films dielectric
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Summary:To derive the spontaneous polarization of a sample, the first harmonic signal of the electric force microscope (EFM) must be corrected using the permittivity. This can be deduced from a simple EFM-force model and has been verified in experiments. For thin films of high permittivity, any gap of air between the tip and the sample prevents the accurate measurement of the permittivity. Therefore, the contact mode of EFM has to be chosen for measurements of the spontaneous polarization of such films.
ISSN:0039-6028
1879-2758
DOI:10.1016/S0039-6028(98)00585-8