Microstructures of island metal films—the computer simulations and statistical description

The ranges of statistical description of the systems may be determined on the basis of inverse power law (Mandelbrot law). The slope of the straight line representing the power law in a double-logarithmic plot, determined as (−1/μ) (μ being a critical exponent), characterizes the distribution of ele...

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Bibliographic Details
Published in:Vacuum 2001-07, Vol.63 (1-2), p.59-65
Main Authors: Dobierzewska-Mozrzymas, E, Biegański, P, Szymczak, G
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Island films
Materials science
Metals. Metallurgy
Methods of deposition of films and coatings
film growth and epitaxy
Microstructures
Physics
Statistical descriptions
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Theory and models of film growth
Thin film structure and morphology
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Summary:The ranges of statistical description of the systems may be determined on the basis of inverse power law (Mandelbrot law). The slope of the straight line representing the power law in a double-logarithmic plot, determined as (−1/μ) (μ being a critical exponent), characterizes the distribution of elements in the microstructure. For μ>2, two parameters of distribution (the mean value and the variance) are finite, Gaussian or log-normal distribution describes the system. When 1
ISSN:0042-207X
1879-2715
DOI:10.1016/S0042-207X(01)00171-3