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Conducting wires embedded in an i-GaAs matrix for electronic applications
A method of fabricating quasi-1D conducting wires of tin embedded in an i-GaAs matrix has been developed. The method involves forming a system of steps on vicinal surface of the GaAs(Cr) substrate misoriented 0.3° or 1° from the (001) plane forward to the (110) basal plane and decorating the ends of...
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Published in: | Microelectronic engineering 1998-08, Vol.43-44, p.319-324 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | A method of fabricating quasi-1D conducting wires of tin embedded in an i-GaAs matrix has been developed. The method involves forming a system of steps on vicinal surface of the GaAs(Cr) substrate misoriented 0.3° or 1° from the (001) plane forward to the (110) basal plane and decorating the ends of these steps with Sn through molecular-beam epitaxy. Transport properties of structures were measured in the temperature range 4.2–300 K at high electric fields up to E=104 V/cm using a pulse technique. |
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ISSN: | 0167-9317 1873-5568 |
DOI: | 10.1016/S0167-9317(98)00180-4 |