Secondary cluster ion distributions produced by MeV ion impacts on Group IIA oxides and nitrates

Cluster ion distributions from MeV atomic ion impacts (fission fragments from 252Cf on divalent Group IIA (GIIA) oxides and nitrates have been examined. The two predominant positive cluster species observed from both solids, (MO) n H + and (MO) n M + (M denotes metal atom) are evidence of a localize...

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Bibliographic Details
Published in:International journal of mass spectrometry and ion processes 1996, Vol.155 (1), p.89-97
Main Authors: Ferrell, W.R., von Heimburg, S.L., Van Stipdonk, M.J., Schweikert, E.A.
Format: Article
Language:English
Subjects:
Clusters
Group IIA nitrates
Group IIA oxides
Magic numbers
Time-of-flight mass spectrometry
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Summary:Cluster ion distributions from MeV atomic ion impacts (fission fragments from 252Cf on divalent Group IIA (GIIA) oxides and nitrates have been examined. The two predominant positive cluster species observed from both solids, (MO) n H + and (MO) n M + (M denotes metal atom) are evidence of a localized plasma state thought to be created by discrete MeV ion impacts. Cluster intensities and extent of clustering from nitrates were generally greater than those from oxides. The enhanced abundances at certain “magic numbers” of n observed in the mass spectra are believed to arise during the actual cluster production process. These periodic enhancements in cluster stabilities are attributed to the adoption by size-specific clusters of atomic arrangements analogous to segments of the rock salt lattice of the GIIA oxides. Cluster stabilities for the GIIA oxides and nitrates are influenced by the ionicity of M-O bonds, formal valence of metal and radius of cation.
ISSN:0168-1176
1873-2801
DOI:10.1016/S0168-1176(96)04389-3