A multi-parameter system for acquisition, monitoring, and analysis of scanning ion microprobe data

The multi-parameter data-acquisition system for the Eindhoven scanning ion microprobe set-up is described. The front-end part of the system is based on an M68030 in VME and handles real-time data acquisition, experiment control and data transport. It is linked to a DEC ALPHA-AXP workstation for data...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 1997-07, Vol.130 (1), p.127-132
Main Authors: Mutsaers, P.H.A., Simons, D.P.L.
Format: Article
Language:English
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Summary:The multi-parameter data-acquisition system for the Eindhoven scanning ion microprobe set-up is described. The front-end part of the system is based on an M68030 in VME and handles real-time data acquisition, experiment control and data transport. It is linked to a DEC ALPHA-AXP workstation for data storage, on-line data monitoring and data analysis and off-line data analysis. The system can be used to apply simultaneously the micro-PIXE, NBS and NFS techniques to determine elemental concentration distributions on biomedical samples, but can also be used for coincident ion scattering experiments and time or dose dependent studies of e.g. ion-beam induced radiation damage.
ISSN:0168-583X
1872-9584
DOI:10.1016/S0168-583X(97)00272-3