Effect of ion position on single-event transient current

Using focused high-energy microbeams of carbon- and oxygen-ions and a high speed, wide bandwidth measurement system, we found a strong dependence of the collected charge and the transient current waveform on the position of ion incidences. Single-event charge is collected by a diffusion mechanism ev...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 1997-07, Vol.130 (1), p.486-490
Main Authors: Hirao, Toshio, Nashiyama, Isamu, Kamiya, Tomihiro, Suda, Tamotsu, Sakai, Takuro, Hamano, Tsuyoshi
Format: Article
Language:English
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Summary:Using focused high-energy microbeams of carbon- and oxygen-ions and a high speed, wide bandwidth measurement system, we found a strong dependence of the collected charge and the transient current waveform on the position of ion incidences. Single-event charge is collected by a diffusion mechanism even when the ion strikes a position about 3 ∼ 4 μm away from the lateral boundary of the p +n-junction area.
ISSN:0168-583X
1872-9584
DOI:10.1016/S0168-583X(97)00377-7