Trace element fingerprinting of jewellery rubies by external beam PIXE

External beam PIXE analysis allows the non-destructive in situ characterisation of gemstones mounted on jewellery pieces. This technique was used for the determination of the geographical origin of 64 rubies set on a high-valued necklace. The trace element content of these gemstones was measured and...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 1999-04, Vol.150 (1-4), p.628-634
Main Authors: Calligaro, T, Poirot, J.-P, Querré, G
Format: Article
Language:English
Subjects:
External beam
Jewel
Multivariate analysis
PIXE
Provenance
Ruby
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Summary:External beam PIXE analysis allows the non-destructive in situ characterisation of gemstones mounted on jewellery pieces. This technique was used for the determination of the geographical origin of 64 rubies set on a high-valued necklace. The trace element content of these gemstones was measured and compared to that of a set of rubies of known sources. Multivariate statistical processing of the results allowed us to infer the provenance of rubies : one comes from Thailand/Cambodia deposit while the remaining are attributed to Burma. This highlights the complementary capabilities of PIXE and conventional gemological observations.
ISSN:0168-583X
1872-9584
DOI:10.1016/S0168-583X(98)01004-0