Characterising palladium–silver and palladium–nickel alloy membranes using SEM, XRD and PIXE

• Published in: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 1999-09, Vol.158 (1-4), p.678-682
• Main Authors: Keuler, J.N, Lorenzen, L, Sanderson, R.D, Prozesky, V, Przybylowicz, W.J
• Format: Article
• Language: English
• ISSN: 0168-583X; 1872-9584
• DOI: 10.1016/S0168-583X(99)00326-2

Palladium alloy membranes were prepared by successive electroless plating steps on an alumina–zirconia support membrane. Palladium, silver and nickel were deposited in layers and then the metal films were heat treated for 5 h in a hydrogen atmosphere at 650°C. The topography of the metal coatings and cross-sections of the films (before and after heating) were characterised using scanning electron microscopy (SEM). XRD was used to determine the crystal phase of the alloy coatings. Both SEM and XRD provide only surface information and therfore micro-PIXE was used to extract depth information of the alloy coating. Concentration profiles across the thickness of the films were constructed to determine penetration of the coating into the support membrane pores during electroless plating and to investigate diffusion of coated layers during the heating step.