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Noise measurements on Si sensors

Developing silicon strip sensors for the CMS Preshower detector we have noticed that some strips have a noise higher than the average and not correlated to a high leakage current. In order to investigate this effect we have developed a set-up for noise measurement on wafers and diced sensors that do...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2002-11, Vol.493 (1), p.25-29
Main Authors: Evangelou, I, Kokkas, P, Manthos, N, Prouskas, C, Triantis, F, Tzoulis, N, Aspell, P, Barney, D, Bloch, Ph, Kloukinas, K, Peisert, A, Reynaud, S, Go, A, Elsha, V, Zubarev, E, Cheremukhin, A, Zamiatin, N
Format: Article
Language:English
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Summary:Developing silicon strip sensors for the CMS Preshower detector we have noticed that some strips have a noise higher than the average and not correlated to a high leakage current. In order to investigate this effect we have developed a set-up for noise measurement on wafers and diced sensors that does not require bonding. The set-up is based on the DeltaStream chip coupled to a probe card. We have tested 45 sensors and found that the strips with an above average noise have a higher relative current increase as a function of voltage, Δ I/( IΔ V). We also observed that, on these strips, the breakdown occurs within about 60 V from the voltage at which the noise is observed. We describe our measurement method and present the results.
ISSN:0168-9002
1872-9576
DOI:10.1016/S0168-9002(02)01556-5