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Noise measurements on Si sensors
Developing silicon strip sensors for the CMS Preshower detector we have noticed that some strips have a noise higher than the average and not correlated to a high leakage current. In order to investigate this effect we have developed a set-up for noise measurement on wafers and diced sensors that do...
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Published in: | Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2002-11, Vol.493 (1), p.25-29 |
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Main Authors: | , , , , , , , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Developing silicon strip sensors for the CMS Preshower detector we have noticed that some strips have a noise higher than the average and not correlated to a high leakage current. In order to investigate this effect we have developed a set-up for noise measurement on wafers and diced sensors that does not require bonding. The set-up is based on the DeltaStream chip coupled to a probe card. We have tested 45 sensors and found that the strips with an above average noise have a higher relative current increase as a function of voltage, Δ
I/(
IΔ
V). We also observed that, on these strips, the breakdown occurs within about
60
V
from the voltage at which the noise is observed. We describe our measurement method and present the results. |
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ISSN: | 0168-9002 1872-9576 |
DOI: | 10.1016/S0168-9002(02)01556-5 |