Geochemistry of trace elements in the highland lunar rocks based on SRXFA data

X-ray fluorescence analysis using synchrotron radiation (SRXFA) has been applied for determination of trace elements in the highland lunar rocks (Luna 20 and Apollo 16). On the basis of the distribution of Rb, Sr, Y, Zr, and Nb in 69 lunar highland fragments six geochemical groups of rocks with vari...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 1998-03, Vol.405 (2), p.590-598
Main Authors: Tarasov, L.S., Kudryashova, A.F., Ulyanov, A.A., Baryshev, V.B., Zolotarev, K.V.
Format: Article
Language:English
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Summary:X-ray fluorescence analysis using synchrotron radiation (SRXFA) has been applied for determination of trace elements in the highland lunar rocks (Luna 20 and Apollo 16). On the basis of the distribution of Rb, Sr, Y, Zr, and Nb in 69 lunar highland fragments six geochemical groups of rocks with various aluminium and trace element contents were distinguished for each station. They have various levels of trace element content. This suggests the various petrological processes: cumulation of rock-forming minerals and partial melting of source rocks. The last process lead up to enriching in trace elements in rocks formed from these melts. The distribution of trace elements in highland and mare rocks of the Moon were compared.
ISSN:0168-9002
1872-9576
DOI:10.1016/S0168-9002(96)01124-2