Characterisation of the BaTiO3/p-Si interface and applications

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Bibliographic Details
Published in:Applied surface science 2000-10, Vol.166 (1-4), p.504-507
Main Authors: EVANGELOU, E. K, KONOFAOS, N, CRAVEN, M. R, CRANTON, W. M, THOMAS, C. B
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Electronic transport in interface structures
Exact sciences and technology
Metal-insulator-semiconductor structures (including semiconductor-to-insulator)
Physics
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ISSN:0169-4332
1873-5584
DOI:10.1016/S0169-4332(00)00483-9