Observation of Si(100) surface with noncontact atomic force microscope at 5K

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Bibliographic Details
Published in:Applied surface science 2002-03, Vol.188 (3-4), p.279-284
Main Authors: Uozumi, T., Tomiyoshi, Y., Suehira, N., Sugawara, Y., Morita, S.
Format: Article
Language:English
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ISSN:0169-4332
DOI:10.1016/S0169-4332(01)00939-4